Bibliography of the person, including all types of documents, not only theses.

MSc theses (2)

1. Domen Gnidovec: Numerično modeliranje srčnožilnega sistema s sklapljanjem 0D modela z 2D modelom
2. Marko Zarač: Numerično modeliranje strukturnega adhezivnega spoja vlakensko ojačanega poliestra in jekla

Other documents (9)

1. Janez Urevc, Primož Rus, Miroslav Halilovič: Uporaba utežene integralske formulacije za izboljšanje natančnosti kolokacijskih metod tipa Runge-Kutta
2. Štefan Obid, Miroslav Halilovič, Janez Urevc, Bojan Starman: Non-linear elastic tension–compression asymmetric anisotropic model for fibre-reinforced composite materials
3. Janez Urevc, Miroslav Halilovič: Enhancing accuracy of Runge–Kutta-type collocation methods for solving ODEs
4. Andraž Maček, Janez Urevc, Bojan Starman, Miroslav Halilovič: Parameters' confidence intervals evaluation for heterogeneous strain field specimen designs by using digital image correlation
5. Vishwajeet Shankhwar, Janez Urevc, Bianca Steuber, Karin Schimd-Zalaudek, Andrej Bergauer, Hanan Alsuwaidi, Stefan Du Plessis, Alawi Alsheikh-Ali, Catherine Kellett, Riad Bayoumi, Andrew Phillip Blaber, Nandu Goswami: Association of gender with cardiovascular and autonomic responses to central hypovolemia
6. Adam Salon, Nikola Vladic, Karin Schimd-Zalaudek, Bianca Steuber, Anna Hawliczek, Janez Urevc, Andrej Bergauer, Vid Pivec, Vishwajeet Shankhwar, Nandu Goswami: Sex variations in retinal microcirculation response to lower body negative pressure
7. Andraž Maček, Bojan Starman, Sam Coppieters, Janez Urevc, Miroslav Halilovič: Confidence intervals of inversely identified material model parameters
8. Vishwajeet Shankhwar, Janez Urevc, Bianca Steuber, Karin Schimd-Zalaudek, Adam Salon, Anna Hawliczek, Andrej Bergauer, Khawla Aljasmi, Asrar Abdi, Asmaa Naser: Effects of menstrual cycle on hemodynamic and autonomic responses to central hypovolemia
9. Štefan Obid, Bojan Starman, Janez Urevc, Miroslav Halilovič: Extraction of uniaxial stress–strain curve from bending test using DIC measurements