The thesis addresses the problem of operational anomalies during image acquisition with an industrial camera triggered by an external signal. At high image acquisition frequencies, errors during image acquisition are possible; in this thesis, we attempt to locate measurement errors and investigate the cause of the occurrence of each individual type of error. For the purpose of determining the consequences of errors in the image storage process, a microcontroller system was established for the simultaneous control of LEDs and triggering of the industrial camera. The experimental system in this work
proved to be a good method for verifying the reliability of the measurement system with an industrial camera. A binary bus consisting of LEDs with a known sequence of switching combinations, which were recorded by the camera triggered by a signal from the microcontroller, enabled a simple method for proving lost images without the need for additional measuring devices, since, in addition to the image metadata, a visual method of confirming that an image acquisition error had occurred was also available.
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