Improving IV curve measurement accuracy of high-efficiency PV modules using extrapolation based on a dual load capacitor scanning method

Oražem, Jonas Aleksander (avtor), Topič, Marko (avtor), Jankovec, Marko (avtor)

With continuous progress in photovoltaic (PV) technology, the conversion efficiency of commercial PV modules is steadily increasing well above 20 %, even exceeding 24 %. Such high-efficiency (HE) PV modules typically exhibit long free-carrier lifetimes, resulting in high diffusion capacitances. For routine field testing, technicians rely on fast, affordable and portable IV curve scanners, which typically employ the load capacitor scanning method. When applied to HE PV modules with high internal capacitance, this method frequently leads to IV curve distortion, resulting in a significant underestimation of the measured maximum power point (MPP). In this paper, we propose a novel extrapolation technique that corrects the distortion of the measured IV curve through two consecutive IV scans using two different load capacitors. The extrapolation algorithm uses a dynamic electrical model of the whole system, including the PV module and the measurement setup, to compensate for the effect of the PV module’s capacitance on the acquired IV curve shape. It extracts two free parameters related to series resistance and the lifetime of the minority carriers that give the best match between the two extrapolated IV curves. We validated the method on four different state-of-the-art HE PV modules (HIT, TOPCon, IBC, and PERC), reliably reducing the MPP error from the initial up to 4 % to less than 1 %.

• Jezik: Angleški jezik
• Ključne besede: difussion capacitance, dynamic modelling, high-efficiency PV modules, IV curve extrapolation, load capacitor IV scanning method, measurement accuracy
• Vrsta gradiva: Članek v reviji
• Tipologija: 1.01 - Izvirni znanstveni članek
• Organizacija: FE - Fakulteta za elektrotehniko
• Status publikacije: Objavljeno
• Različica publikacije: Objavljena publikacija
• Leto izida: 2025
• Št. strani: Str. 214960-214970
• Številčenje: Vol. 13
• PID: 20.500.12556/RUL-177847
• UDK: 621.38
• ISSN pri članku: 2169-3536
• DOI: 10.1109/ACCESS.2025.3645420
• COBISS.SI-ID: 262738179
• Datum objave v RUL: 09.01.2026

Gradivo je del revije

• Naslov: IEEE access
• Založnik: Institute of Electrical and Electronics Engineers
• ISSN: 2169-3536
• COBISS.SI-ID: 519839513

Licence

• Licenca: CC BY 4.0, Creative Commons Priznanje avtorstva 4.0 Mednarodna
• Povezava: http://creativecommons.org/licenses/by/4.0/deed.sl
• Opis: To je standardna licenca Creative Commons, ki daje uporabnikom največ možnosti za nadaljnjo uporabo dela, pri čemer morajo navesti avtorja.

Sekundarni jezik

• Jezik: Slovenski jezik
• Ključne besede: difuzijska kapacitivnost, dinamično modeliranje, visokoučinkoviti PV moduli, ekstrapolacija IU krivulje, metoda IU skeniranja z bremenskim kondenzatorjem, merilna negotovost

Projekti

• Financer: ARIS - Javna agencija za znanstvenoraziskovalno in inovacijsko dejavnost Republike Slovenije
• Številka projekta: P2-0415
• Naslov: Fotovoltaika in elektronika