Podrobno

In-air micro-PIXE mapping with chemical contrast
ID Kavčič, Matjaž (Avtor), ID Rajh, Ava (Avtor)

.pdfPDF - Predstavitvena datoteka, prenos (8,40 MB)
MD5: 877987D8D071B9B97CBA677A0454B107
URLURL - Izvorni URL, za dostop obiščite https://pubs.acs.org/doi/10.1021/acs.analchem.5c00943 Povezava se odpre v novem oknu

Izvleček
Currently, chemically specific X-ray fluorescence imaging is restricted to synchrotron facilities and based on the chemical selectivity of X-ray absorption spectra. In this article, we demonstrate the capability of high-energy-resolution micro-PIXE spectroscopy to perform two-dimensional (2D) chemical state mapping of sulfur and phosphorus within spatially inhomogeneous model samples. The approach is based on the parallel-beam wavelength-dispersive tender X-ray emission spectrometer combining polycapillary X-ray optics with diffraction on a flat crystal analyzer, which is used to record chemically sensitive Kβ X-ray emission. This was used to maximize the fluorescence signal of one chemical species vs the other and record 2D maps with pronounced chemical contrast. The ratio of intensities recorded at two preselected X-ray emission energies was used as a unique spectral signature of the particular chemical state to yield pure chemical state maps with high lateral resolution provided by the focused proton beam. The presented approach is not restricted to micro-PIXE but is also applicable to other micro X-ray fluorescence imaging techniques commonly applied in various research fields.

Jezik:Angleški jezik
Ključne besede:energy, mass spectrometers, phosphorus, sulfur, X-rays
Vrsta gradiva:Članek v reviji
Tipologija:1.01 - Izvirni znanstveni članek
Organizacija:FMF - Fakulteta za matematiko in fiziko
Status publikacije:Objavljeno
Različica publikacije:Objavljena publikacija
Leto izida:2025
Št. strani:Str. 11636-11642
Številčenje:Vol. 97, iss. 22
PID:20.500.12556/RUL-176552 Povezava se odpre v novem oknu
UDK:539
ISSN pri članku:1520-6882
DOI:10.1021/acs.analchem.5c00943 Povezava se odpre v novem oknu
COBISS.SI-ID:239158275 Povezava se odpre v novem oknu
Datum objave v RUL:03.12.2025
Število ogledov:74
Število prenosov:34
Metapodatki:XML DC-XML DC-RDF
:
Kopiraj citat
Objavi na:Bookmark and Share

Gradivo je del revije

Naslov:Analytical chemistry
Skrajšan naslov:Anal. chem.
Založnik:American Chemical Society
ISSN:1520-6882
COBISS.SI-ID:16999719 Povezava se odpre v novem oknu

Licence

Licenca:CC BY 4.0, Creative Commons Priznanje avtorstva 4.0 Mednarodna
Povezava:http://creativecommons.org/licenses/by/4.0/deed.sl
Opis:To je standardna licenca Creative Commons, ki daje uporabnikom največ možnosti za nadaljnjo uporabo dela, pri čemer morajo navesti avtorja.

Sekundarni jezik

Jezik:Slovenski jezik
Ključne besede:rentgenski žarki, spektroskopija, žveplo, fosfor

Projekti

Financer:EC - European Commission
Program financ.:H2020
Številka projekta:824096
Naslov:Research And Development with Ion Beams – Advancing Technology in Europe
Akronim:RADIATE

Financer:ARRS - Agencija za raziskovalno dejavnost Republike Slovenije
Številka projekta:P1-0112
Naslov:Raziskave atomov, molekul in struktur s fotoni in delci

Podobna dela

Podobna dela v RUL:
Podobna dela v drugih slovenskih zbirkah:

Nazaj