In industry, machine vision is often used for defect detection in products. In cases where this is not feasible, alternative methods must be developed. Within this thesis, a model with an autoencoder convolutional neural network was designed to reconstruct an image of the product, displaying the location of the defect, based on spectrograms of the dynamic response. It was found that in most cases the model accurately determines the defect location on the product and reconstructs the corresponding image.
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