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Irradiance in mixed coherent/incoherent structures : an analytical approach
ID Puhan, Janez (Avtor), ID Bűrmen, Árpád (Avtor), ID Tuma, Tadej (Avtor), ID Fajfar, Iztok (Avtor)

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Izvleček
We propose a new method for a light energy flux density (or irradiance) calculation in an arbitrary multilayer stack containing coherent and incoherent layers. Although the well known General Transfer-Matrix Method (GTMM) can be successfully used for the overall reflectance and transmittance calculation, it does not allow us to obtain the corresponding irradiance depth profile straightforwardly. We show in this paper that subsequent phase-shift integrations over the incoherent layers result in the reflectance and transmittance expressions identical to those of the GTMM formulation. However, the alternative mathematical approach allows us to derive an analytical expression for irradiance at an arbitrary depth of the multilayer stack, thus making it possible to calculate the absorptance depth profile. In fact, the GTMM expressions for the overall reflectance and transmittance turn out to be special cases of the irradiance calculation at the incident and emergent surface of the multilayer stack. Consequently, the proposed Phase-shift Integration Method (PIM) represents a continuous irradiance calculation model without any energy imbalances on layer interfaces. In addition, since we are able to obtain analytical layer thickness derivatives, the PIM is suitable for use with gradient optimization methods. We verify the method on three cases of an encapsulated bifacial heterojunction silicon (HJ Si) solar cell, a perovskite solar cell, and a perovskite/silicon tandem solar cell, which all consist of thin and thick layers.

Jezik:Angleški jezik
Ključne besede:irradiance, incoherence, general transfer-matrix method, transfer-matrix formalism, multilayer, thin-film structure
Vrsta gradiva:Članek v reviji
Tipologija:1.01 - Izvirni znanstveni članek
Organizacija:FE - Fakulteta za elektrotehniko
Status publikacije:Objavljeno
Različica publikacije:Objavljena publikacija
Leto izida:2019
Št. strani:16 str.
Številčenje:Vol. 9, iss. 9, art. 536
PID:20.500.12556/RUL-132777 Povezava se odpre v novem oknu
UDK:621.3:535
ISSN pri članku:2079-6412
DOI:10.3390/coatings9090536 Povezava se odpre v novem oknu
COBISS.SI-ID:12640596 Povezava se odpre v novem oknu
Datum objave v RUL:03.11.2021
Število ogledov:471
Število prenosov:143
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Gradivo je del revije

Naslov:Coatings
Skrajšan naslov:Coatings
Založnik:MDPI AG
ISSN:2079-6412
COBISS.SI-ID:523035673 Povezava se odpre v novem oknu

Licence

Licenca:CC BY 4.0, Creative Commons Priznanje avtorstva 4.0 Mednarodna
Povezava:http://creativecommons.org/licenses/by/4.0/deed.sl
Opis:To je standardna licenca Creative Commons, ki daje uporabnikom največ možnosti za nadaljnjo uporabo dela, pri čemer morajo navesti avtorja.
Začetek licenciranja:01.09.2019

Sekundarni jezik

Jezik:Slovenski jezik
Ključne besede:obsevanje, nekoherenca, metoda prenosnih matrik, večplastnost, tankoplastna struktura

Projekti

Financer:ARRS - Agencija za raziskovalno dejavnost Republike Slovenije
Številka projekta:P2-0246
Naslov:ICT4QoL - Informacijsko komunikacijske tehnologije za kakovostno življenje

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