This work describes development testing of integrated circuit for RFID tag, which is also capable of capturing data with integrated internal or external sensors. Such devices are called smart active label – SAL. Basics of RFID system and its components are briefly described. Making of testing system, which is made of testing circuit and software, is described. Methods used and some measurement results are also presented. Structure of the measured object, integrated circuit SAL_UHF, is presented with block diagrams. Only testing of some functions of integrated circuit are described in this work, since testing all functions would produce too much data for this paper. The purpose of this work is to thoroughly and reliably measure parameters and functionality of integrated circuit.