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Razvojno testiranje RFID značke : diplomsko delo
Štraus, Darko (Author), Pleteršek, Anton (Mentor) More about this mentor... This link opens in a new window, Kramberger, Iztok (Co-mentor)

URLURL - Presentation file, Visit http://dkum.uni-mb.si/Dokument.php?id=10285 This link opens in a new window

Abstract
V diplomski nalogi je predstavljeno razvojno testiranje integriranega vezja za RFID značko, ki ima dodatno funkcionalnost za zajemanje podatkov integriranih in zunanjih analognih senzorjev in jo imenujemo pametna nalepka SAL. Na kratko so opisane osnove delovanja RFID sistemov in njihove komponente. Predstavljena je priprava testnega sistema, ki ga sestavlja testno vezje in programska oprema za izvajanje meritev. Predstavljene so metode, ki so bile uporabljene za merjenje integriranega vezja in nekateri rezultati meritev. Zgradba merjenca, integriranega vezja SAL_UHF, je predstavljena z blokovnimi diagrami. V diplomski nalogi smo se omejili na testiranje nekaterih funkcij integriranega vezja, saj bi bilo testiranje vseh funkcij za diplomsko nalogo preobsežna dokumentacija. Namen diplomske naloge je temeljito in zanesljivo meriti parametre in funkcionalnost integriranega vezja.

Language:Slovenian
Keywords:izpraševalnik, značka, pametna nalepka, aktivna nalepka, pasivna nalepka, RFID, EPC-GEN2, parametrični test, funkcionalni test, univerzitetni študij, diplomske naloge
Work type:Undergraduate thesis (m5)
Tipology:2.11 - Undergraduate Thesis
Organization:FE - Faculty of Electrical Engineering
Year:2009
Publisher:[D. Štraus]
Number of pages:VII, 58 f.
UDC:621.396/.398(043.2)
COBISS.SI-ID:7291732 Link is opened in a new window
Views:265
Downloads:124
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Secondary language

Language:English
Title:DEVELOPMENT TESTING OF AN RFID TAG
Abstract:
This work describes development testing of integrated circuit for RFID tag, which is also capable of capturing data with integrated internal or external sensors. Such devices are called smart active label – SAL. Basics of RFID system and its components are briefly described. Making of testing system, which is made of testing circuit and software, is described. Methods used and some measurement results are also presented. Structure of the measured object, integrated circuit SAL_UHF, is presented with block diagrams. Only testing of some functions of integrated circuit are described in this work, since testing all functions would produce too much data for this paper. The purpose of this work is to thoroughly and reliably measure parameters and functionality of integrated circuit.

Keywords:integrated circuit testing, RFID system

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