Lokalna karakterizacija piezoelektričnih in feroelektričnih lastnosti keramičnih plasti in kompozitnih nanopalčk

Fišinger, Val (author), Kutnjak, Zdravko (mentor), Uršič Nemevšek, Hana (comentor)

V delu smo raziskali feroelektrične in piezoelektrične lastnosti dveh sistemov: debelih plasti $\mathrm{0.5BaZr_{0.2}Ti_{0.8}O_3–0.5Ba_{0.7}Ca_{0.3}TiO_3}$ (BZT-BCT) in kompozitnih nanopalčk $\mathrm{CoFe_2O_4/(Ba_{0.95}Ca_{0.05})(Ti_{0.89}Sn_{0.11})O_3}$ (CFO/BCTS), pri čemer smo uporabili tehnike mikroskopa na atomsko silo. Pri debelih plasteh BZT-BCT smo ugotovili homogeno mikrostrukturo. S piezoodzivno mikroskopijo (PFM) smo pokazali, da plasti izkazujejo piezoelektrični odziv. Zaznali smo tudi preklapljanje feroelektričnih domen znotraj plasti. Meritve PFM kompozitnih nanopalčk CFO/BCTS so pokazale piezoelektrični odziv v vertikalni in literarni smeri in potrdile preklapljanje feroelektričnih domen. Izmerjen je bil maksimalni lokalni piezoelektrični koeficient d$_{33} \approx 6 \ \mathrm{\frac{pm}{V}}$. Znotraj nanopalčk so bila zaznana tudi območja brez piezoelektričnega odziva, ki ustrezajo fazi CFO. PFM je nepogrešljivo orodje za analizo feroelektričnih materialov. Pridobljene ugotovitve prispevajo k boljšemu razumevanju feroelektričnih lastnosti vzorcev na nanoravni in potrjujejo njihov potencial za uporabo v senzorskih in drugih funkcijskih napravah.

• Language: Slovenian
• Keywords: feroelektriki, piezoelektrični materiali, debele keramične plasti $\mathrm{0.5BaZr_{0.2}Ti_{0.8}O_3–0.5Ba_{0.7}Ca_{0.3}TiO_3}$, kompozitne nanopalčke $\mathrm{CoFe_2O_4/(Ba_{0.95}Ca_{0.05})(Ti_{0.89}Sn_{0.11})O_3}$, mikroskopija na atomsko silo, piezoodzivna mikroskopija, multiferoični materiali
• Work type: Bachelor thesis/paper
• Typology: 2.11 - Undergraduate Thesis
• Organization: FMF - Faculty of Mathematics and Physics
• Year: 2025
• PID: 20.500.12556/RUL-177291
• COBISS.SI-ID: 260826627
• Publication date in RUL: 19.12.2025

Secondary language

• Language: English
• Title: Local characterization of the piezoelectric and ferroelectric properties of ceramic films and composite nanorods

Abstract

In this work, we investigated the ferroelectric and piezoelectric properties of two systems: $\mathrm{0.5BaZr_{0.2}Ti_{0.8}O_3–0.5Ba_{0.7}Ca_{0.3}TiO_3}$ (BZT-BCT) thick films and $\mathrm{CoFe_2O_4/(Ba_{0.95}Ca_{0.05})(Ti_{0.89}Sn_{0.11})O_3}$ (CFO/BCTS) composite nanorods. The investigation was carried out using advanced atomic force microscopy techniques. For the BZT-BCT thick films, we confirmed a homogeneous microstructure. Piezoresponse force microscopy (PFM) demonstrated that the films exhibit a clear piezoelectric response, and domain switching characteristic of ferroelectricity was also observed. PFM measurements of the CFO/BCTS composite nanorods revealed piezoelectric responses in both the vertical and lateral directions, confirming ferroelectric domain switching. The maximum local piezoelectric coefficient was determined to be d$_{33} \approx 6 \ \mathrm{\frac{pm}{V}}$. In addition, certain regions within the nanorods showed no piezoelectric activity, which correspond to the CFO phase. These results highlight PFM as an indispensable tool for nanoscale characterization of ferroelectric materials. The findings provide valuable insights into the local electromechanical behavior of BZT-BCT thick films and CFO/BCTS nanorods and confirm their potential for applications in sensors and other functional devices.

• Keywords: ferroelectrics, piezoelectric materials, $\mathrm{0.5BaZr_{0.2}Ti_{0.8}O_3–0.5Ba_{0.7}Ca_{0.3}TiO_3}$ ceramic thick films, $\mathrm{CoFe_2O_4/(Ba_{0.95}Ca_{0.05})(Ti_{0.89}Sn_{0.11})O_3}$ composite nanorods, atomic force microscopy (AFM), piezoresponse force microscopy (PFM), multiferroic materials