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Karakterizacija nanolusk $\mathrm{Mo_{1-x}W_xS_2}$ z Ramansko spektroskopijo in s kontaktno mikroskopijo na atomsko silo
ID Šolar, Ana Marija (Author), ID Remškar, Maja (Mentor) More about this mentor... This link opens in a new window, ID Pogačnik Krajnc, Anja (Comentor)

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Abstract
V zaključnem delu sem sintetizirala in karakterizirala nanoluske $\mathrm{Mo_{1-x}W_xS_2}$, ki rastejo iz parne faze elementov molibdena, volframa in žvepla med kemijsko transportno reakcijo. Površinsko strukturo in topografijo nanolusk sem raziskala s kontaktno mikroskopijo na atomsko silo (c-AFM). Osredotočila sem se na višinske profile lusk, iz katerih sem ocenila debelino posamezne plasti $\mathrm{Mo_{1-x}W_xS_2}$. Optične lastnosti lusk sem raziskala s konfokalno Ramansko spektroskopijo, s katero sem določila Ramansko aktivna vibracijska stanja. Primerjala sem spektre posnete s 532 nm in 633 nm vzbujevalnima valovnima dolžinama. Z Ramanskim kartiranjem preko nanoluske sem identificirala lokalne kemijske razlike na nanoluskah. V nalogi sem se osredotočila na uporabo omenjenih metod pri karakterizaciji nanostrukturnih ternarnih materialov na primeru nanolusk $\mathrm{Mo_{1-x}W_xS_2}$.

Language:Slovenian
Keywords:$\mathrm{Mo_{1-x}W_xS_2}$, nanoluske, kemijska transportna reakcija (CVT), kontaktna mikroskopija na atomsko silo (c-AFM), konfokalna Ramanska spektroskopija
Work type:Final paper
Typology:2.11 - Undergraduate Thesis
Organization:FMF - Faculty of Mathematics and Physics
Year:2025
PID:20.500.12556/RUL-174448 This link opens in a new window
COBISS.SI-ID:249614083 This link opens in a new window
Publication date in RUL:02.10.2025
Views:175
Downloads:90
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Secondary language

Language:English
Title:Characterization of $\mathrm{Mo_{1-x}W_xS_2}$ nanoscales by Raman spectroscopy and contact-mode atomic force microscopy
Abstract:
For my thesis, I synthesized and characterized $\mathrm{Mo_{1-x}W_xS_2}$ nanoflakes that grow from the vapor phase of the elements molybdenum, tungsten and sulphur during chemical vapor transport reaction. I investigated the surface structure and topography of the flakes using contact atomic force microscopy (c-AFM). I focused on measurements of height profiles from which I estimated the thickness of $\mathrm{Mo_{1-x}W_xS_2}$ single layer. I investigated the optical properties of the flakes using confocal Raman spectroscopy to determine the Raman active vibrational modes. I compared the spectra obtained with 532 nm and 633 nm excitational wavelengths. I identified local chemical differences across flakes using Raman mapping. The thesis is focused on the application of the mentioned methods for the characterization of the nanostructured ternary materials, using $\mathrm{Mo_{1-x}W_xS_2}$ flakes as an example.

Keywords:$\mathrm{Mo_{1-x}W_xS_2}$, nanoflakes, chemical vapor transport (CVT), contact-mode atomic force microscopy (c-AFM), confocal Raman spectroscopy.

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