Sistem za meritev nehomogenosti umetnih svetlobnih virov

Polak, Črtomir (author), Pirc, Matija (mentor)

Umetnim svetilom je pogosto potrebno izmeriti in oceniti ravni njihovih lastnosti. Ena od takih lastnosti je nehomogenost obsevanja, ki ga svetilo oddaja. Ta lastnost je ključnega pomena v okoljih, kjer želimo simulirati določene svetlobne pogoje, kot na primer sončno svetlobo. V laboratorijih, ki se ukvarjajo s fotovoltaiko in optoelektroniko je pogosto potrebno oceniti učinkovitost sončnih celic in raznih drugih sistemov, za to pa je potrebno poznati natančnost sončnih simulatorjev s katerimi te meritve opravijo. Razvili smo merilni sistem, ki določa raven nehomogenosti obsevanja ciljne površine. Sistem gradijo motoriziran dvoosni mehanizem, tiskano vezje s poljem šestnajstih fotodiod in program na osebnem računalniku. Grafični vmesnik na osebnem računalniku omogoča uporabniku nastavitve skenirane površine in ločljivost skeniranja. Poleg tega uporabniku grafično prikaže podatke in zanje izračuna statistične vrednosti ter nehomogenost. Z meritvami sončnega simulatorja, ki oddaja okoli 1000 W/m2 obsevanja, smo izmerili nehomogenost malenkost večjo od 5%, kar klasificira izmerjeni simulator v razred C po standardih IEC 60904-9:2020, ASTM E927-19 in JIS C 8904-9. Z zožitvijo površine merilnega območja smo dosegli manjšo nehomogenost, okvirno 3%, kar izmerjeni simulator uvršča v razred B po zgoraj omenjenih standardih. Dokazali smo, da je sistem zanesljiv tudi pri merjenju šibkejših virov svetlobe, v našem primeru preprosta namizna LED svetilka.

• Language: Slovenian
• Keywords: nehomogenost obsevanja, dvoosni mehanizem, polje fotodiod, sončni simulator
• Work type: Bachelor thesis/paper
• Typology: 2.11 - Undergraduate Thesis
• Organization: FE - Faculty of Electrical Engineering
• Year: 2025
• PID: 20.500.12556/RUL-171643
• COBISS.SI-ID: 248126979
• Publication date in RUL: 29.08.2025

Secondary language

• Language: English
• Title: System for Measuring the Inhomogeneity of Artificial Light Sources

Abstract

Artificial light sources often need to have their properties measured and evaluated. One such property is the non-homogeneity of the iradiance emitted by the light source. This property is crucial in environments where we want to simulate specific lighting conditions, such as sunlight. In laboratories dealing with photovoltaics and optoelectronics, it is often necessary to evaluate the efficiency of solar cells and various other systems, which requires knowledge of the accuracy of the solar simulators used to perform these measurements. We have developed a measurement system that determines the level of irradiance non-homogeneity of the target surface. The system consists of a motorized two-axis mechanism, a printed circuit board with an array of sixteen photodiodes, and a program running on a personal computer. The graphical interface on the personal computer allows the user to set the scanned area and scanning resolution. In addition, it graphically displays the data and calculates statistical values and non-homogeneity for them. With measurements from a solar simulator emitting approximately 1000 W/m2 of irradiance, we measured a non-homogeneity slightly greater than 5%, which classifies the measured simulator as class C according to standards IEC 60904-9:2020, ASTM E927-19, and JIS C 8904-9. By narrowing the surface area of the measurement range, we achieved a lower non-homogeneity of approximately 3%, which classifies the measured simulator as class B according to the above-mentioned standards. We have demonstrated that the system is also reliable when measuring weaker light sources, in our case a simple desktop LED lamp.

• Keywords: Irradiance non-homogeneity, XY mechanism, photodiode array, solar simulator