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Identifikacija kristalnih faz v lepilih za ploščice z rentgensko praškovno difrakcijo​
ID Ivanušič, Anže (Author), ID Počkaj, Marta (Mentor) More about this mentor... This link opens in a new window

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Abstract
Lepila za ploščice so ključni gradbeni material, ki omogočajo trdno in trajno vezavo ploščic na različne površine. Zanimalo me je, katere snovi vsebujejo, zato sem se v diplomski nalogi osredotočil na identifikacijo kristalnih faz v lepilih za ploščice z uporabo rentgenske praškovne difrakcije. Rentgenska praškovna analiza je ena izmed glavnih metod za karakterizacijo trdnih snovi. Temelji na difrakciji rentgenskih žarkov na kristalni strukturi. Uklonska slika, ki pri tem nastane, je značilna za posamezno kristalno snov. V raziskavi sem analiziral deset različnih vzorcev cementnih lepil za ploščice. Po primerjavi njihovih uklonskih slik se je izkazalo, da večina vzorcev vsebuje silicijev dioksid in kalcijev karbonat v večji meri. Snovi, ki so prisotne v manjši količini, vedno nisem mogel identificirati, zato sem izvedel tudi termično analizo vzorcev. Ta analiza je potrdila prisotnost organskih dodatkov, ki so pomembni za izboljšanje lastnosti lepila, kot so fleksibilnost in adhezija.

Language:Slovenian
Keywords:rentgenska praškovna difrakcija, lepila za ploščice, termična analiza
Work type:Bachelor thesis/paper
Typology:2.11 - Undergraduate Thesis
Organization:FKKT - Faculty of Chemistry and Chemical Technology
Year:2024
PID:20.500.12556/RUL-160228 This link opens in a new window
COBISS.SI-ID:206028291 This link opens in a new window
Publication date in RUL:23.08.2024
Views:261
Downloads:72
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Secondary language

Language:English
Title:Identification of crystalline phases in tile adhesives by means of X-ray powder diffraction
Abstract:
Tile adhesives are a key building material that enables a strong and durable bond between tiles and various surfaces. In my thesis, I focused on identifying the crystalline phases in tile adhesives using X-ray powder diffraction (XRPD). XRPD is one of the main methods for characterizing solid substances. It is based on the diffraction of X-rays with the crystal structure. The diffraction pattern generated is characteristic of each crystalline substance. In my research, I analyzed ten different samples of tile adhesives. After comparing their diffraction patterns, it was found that most samples predominantly contain silicon dioxide and calcium carbonate. The substances present in smaller quantities were not always identifiable, so I also conducted thermal analysis of the samples. This analysis confirmed the presence of organic additives, which are important for improving the properties of the adhesive, such as flexibility and adhesion.

Keywords:X-ray powder diffraction, tile adhesives, thermal analysis

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