izpis_h1_title_alt

Analiza metod pospešenega staranja elektronskih komponent : diplomsko delo
ID Tratar, Boštjan (Author), ID Mraz, Miha (Mentor) More about this mentor... This link opens in a new window

.pdfPDF - Presentation file, Download (1,23 MB)
MD5: D6D003C21A2162B2B3535C663DD775DB

Language:Slovenian
Keywords:elektronske komponente, staranje elektronskih komponent, analiza, testiranje, testne komore, računalništvo, visokošolski strokovni študij, diplomske naloge
Work type:Undergraduate thesis
Typology:2.11 - Undergraduate Thesis
Organization:FRI - Faculty of Computer and Information Science
Place of publishing:Ljubljana
Publisher:B. Tratar
Year:2010
Number of pages:32 f.
PID:20.500.12556/RUL-156753 This link opens in a new window
UDC:004(043.2)
COBISS.SI-ID:7575380 This link opens in a new window
Publication date in RUL:26.05.2024
Views:197
Downloads:14
Metadata:XML DC-XML DC-RDF
:
Copy citation
Share:Bookmark and Share

Secondary language

Language:English
Title:Analysis of accelerated life test methods of electronic components

Similar documents

Similar works from RUL:
Similar works from other Slovenian collections:

Back