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Vpliv sevanja na delovanje senzorjev fotonov v detektorju obročev Čerenkova pri eksperimentu Belle II
ID Skrbinšek, Sebastjan (Author), ID Pestotnik, Rok (Mentor) More about this mentor... This link opens in a new window

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Abstract
Pri eksperimentu Belle II je detektor obročev Čerenkova namenjen identifikaciji hitrih nabitih delcev. Nabiti delec emitira fotone, kadar se giblje skozi medij hitreje od svetlobne hitrosti. Fotone zaznamo s pozicijsko občutljivimi senzorji posameznih fotonov. Sevanje iz ozadja povzroča poškodbe kristalne rešetke polprevodniških detektorjev, kar privede do povečanja temnega toka, ki predstavlja šum našemu signalu. Namen naloge je oceniti vpliv sevanja na delovanje identifikacijskega sistema z analizo napajalnih tokov 420 hibridnih plazovnih fotodiod (HAPD) ter dobljene meritve primerjati s pričakovanimi vrednostmi. Naredili bomo tudi pregled senzorjev, ki so bili maskirani zaradi okvar.

Language:Slovenian
Keywords:HAPD, polprevodniški detektorji, sevalne poškodbe, temni tok, ARICH
Work type:Master's thesis/paper
Typology:2.09 - Master's Thesis
Organization:FMF - Faculty of Mathematics and Physics
Year:2023
PID:20.500.12556/RUL-149826 This link opens in a new window
COBISS.SI-ID:163864835 This link opens in a new window
Publication date in RUL:10.09.2023
Views:313
Downloads:68
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Secondary language

Language:English
Title:Effect of radiation on the performance of the photon sensors in the ring imaging Cherenkov detector in the Belle II experiment
Abstract:
In the Belle II experiment, the Cherenkov ring detector is designed to identify fast charged particles. A charged particle emits photons when it moves through a medium faster than the speed of light. Photons are detected by position-sensitive sensors of individual photons. Background radiation causes damage to the crystal lattice of semiconductor detectors, which leads to an increase in dark current, that acts as a source of noise to our detected signal. The purpose of the task is to assess the impact of radiation on the operation of the identification system by analyzing the supply currents of 420 hybrid avalanche photodiodes (HAPD) and to compare the obtained measurements with the expected values. We will also do a review of sensors that have been masked due to malfunctions.

Keywords:HAPD, semiconductor detectors, radiation damage, dark current, ARICH

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