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Irradiance in mixed coherent/incoherent structures : an analytical approach
ID Puhan, Janez (Author), ID Bürmen, Arpad (Author), ID Tuma, Tadej (Author), ID Fajfar, Iztok (Author)

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Abstract
We propose a new method for a light energy flux density (or irradiance) calculation in an arbitrary multilayer stack containing coherent and incoherent layers. Although the well known General Transfer-Matrix Method (GTMM) can be successfully used for the overall reflectance and transmittance calculation, it does not allow us to obtain the corresponding irradiance depth profile straightforwardly. We show in this paper that subsequent phase-shift integrations over the incoherent layers result in the reflectance and transmittance expressions identical to those of the GTMM formulation. However, the alternative mathematical approach allows us to derive an analytical expression for irradiance at an arbitrary depth of the multilayer stack, thus making it possible to calculate the absorptance depth profile. In fact, the GTMM expressions for the overall reflectance and transmittance turn out to be special cases of the irradiance calculation at the incident and emergent surface of the multilayer stack. Consequently, the proposed Phase-shift Integration Method (PIM) represents a continuous irradiance calculation model without any energy imbalances on layer interfaces. In addition, since we are able to obtain analytical layer thickness derivatives, the PIM is suitable for use with gradient optimization methods. We verify the method on three cases of an encapsulated bifacial heterojunction silicon (HJ Si) solar cell, a perovskite solar cell, and a perovskite/silicon tandem solar cell, which all consist of thin and thick layers.

Language:English
Keywords:irradiance, incoherence, general transfer-matrix method, transfer-matrix formalism, multilayer, thin-film structure
Work type:Article
Typology:1.01 - Original Scientific Article
Organization:FE - Faculty of Electrical Engineering
Publication status:Published
Publication version:Version of Record
Year:2019
Number of pages:16 str.
Numbering:Vol. 9, iss. 9, art. 536
PID:20.500.12556/RUL-132777 This link opens in a new window
UDC:621.3:535
ISSN on article:2079-6412
DOI:10.3390/coatings9090536 This link opens in a new window
COBISS.SI-ID:12640596 This link opens in a new window
Publication date in RUL:03.11.2021
Views:727
Downloads:165
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Record is a part of a journal

Title:Coatings
Shortened title:Coatings
Publisher:MDPI AG
ISSN:2079-6412
COBISS.SI-ID:523035673 This link opens in a new window

Licences

License:CC BY 4.0, Creative Commons Attribution 4.0 International
Link:http://creativecommons.org/licenses/by/4.0/
Description:This is the standard Creative Commons license that gives others maximum freedom to do what they want with the work as long as they credit the author.
Licensing start date:01.09.2019

Secondary language

Language:Slovenian
Keywords:obsevanje, nekoherenca, metoda prenosnih matrik, večplastnost, tankoplastna struktura

Projects

Funder:ARRS - Slovenian Research Agency
Project number:P2-0246
Name:ICT4QoL - Informacijsko komunikacijske tehnologije za kakovostno življenje

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