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1. Study of the multilayer PCB CTEs by moiré interferometry Lei Han, Arkady S. Voloshin, Igor Emri, 2004, original scientific article Keywords: moiré interferometry, printed circuit board, coefficient of thermal expansion, thermal deformations, image processing |
2. The effect of temperature on morphology and relaxation behaviour of PA Ted Prodan, Igor Emri, Bernd Steffen von Bernstorff, Arkady S. Voloshin, 2003, published scientific conference contribution abstract Full text (outside link) |