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TEHNOLOGIJE IN PRISTOPI PRI PROIZVODNEM TESTIRANJU KOMPLEKSNIH ELEKTRONSKIH NAPRAV IN SISTEMOV
ID PREVODNIK, BOŠTJAN (Author), ID Jankovec, Marko (Mentor) More about this mentor... This link opens in a new window

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PID: 20.500.12556/rul/e97f9b8d-4a89-420d-a0aa-19d39e6f40eb

Abstract
1. POVZETEK Specialistično delo obravnava področje testnih pristopov, metod, tehnologij in procesov v proizvodnem ciklu testiranja kompleksnih elektronskih naprav in sistemov. Splošni obravnavi tematike v uvodnih poglavjih sledi konkreten primer praktične realizacije takega testnega sistema s tipičnimi problemi in metodami reševanja s katerimi se pri tem srečujemo. V osrednjem delu je v splošnem predstavljena celotna vertikala načrtovanja, verifikacije in končne implementacije posameznih faz avtomatskega testnega sistema ATS za testiranje produktov pri masovni proizvodnji. Iz vidika načrtovanja in realizacije gre za več stopenjski proces, ki je logično strukturiran na posamezne samostojne in neodvisne skupine testov oziroma testne nivoje. Ta razdelitev običajno zajema test ICT in Boundary scan (integriteta povezav na nivoju komponent in tiskanega vezja), programiranje (angl. »bring-up«), funkcijski, termalni, sistemski in konfiguracijski nivo. Vsak od teh nivojev je pomemben člen v proizvodnem ciklu naprave in mora upoštevati določene specifične lastnosti. Proces prehajanja med nivoji je natančno kontroliran in vnaprej določen. Vhodni pogoj vsakega naslednjega testnega nivoja je uspešno končan in zaključen predhodni nivo. Kontrola tega procesa je zagotovljena s primerno arhitekturo testnega sistema in ustrezno načrtovano avtomatsko testno aplikacijo GUI. Slednja deluje v povezavi z mrežno infrastrukturo, testnim strežnikom in informacijskim sistemom za shranjevanje rezultatov (SQL-DB). Implementacija celotnega proizvodnega testnega sistema je praktično predstavljena na izbrani napravi iz področja mikrovalovnega prenosa podatkov proizvajalca Aviat Networks, kjer sem tudi zaposlen. Moje delo tu se nanaša predvsem na področje, ki ga pokriva naslovna tema te naloge. Konkretno gre za digitalno signalno procesno enoto oziroma mikrovalovni usmerjevalnik CTR8540. To je eden večjih projektov, kjer sem bil aktivno udeležen pri razvoju kompletnega testnega sistema od idejne zasnove do končne realizacije. Poudarek naloge je na vhodnih zahtevah in specifikacijah, načinu testiranja, splošni predstavitvi posameznih testnih nivojev, razvoju in pripravi testnih aplikacij, končni verifikaciji in implementaciji, analizi rezultatov ter odpravljanju konkretnih realnih problemov, s katerimi sem se srečeval tako v razvojni, kot tudi kasnejši produkcijski fazi. V zaključnem delu so podane še nekatere dodatne možnosti za razne optimizacije in izboljšave testnega procesa, ki je precej dinamičen in se še vedno razvija v okviru novih tehnologij in pristopov. Pri uvajanju tovrstnih sprememb je vedno potrebno upoštevati večje število dejavnikov (finančne, časovne, tehnične, razpoložljive vire). To je še posebej pomembno, če je testni proces pred tem že konsolidiran. Vsak nepredviden zastoj testnega procesa pri masovni proizvodnji namreč pomeni dodatne stroške, slabše bilance in razne druge negativne vplive. Zato so pri takih spremembah potrebne tehtne odločitve. Realizacija in implementacija izvorno podanih zahtev ali morebitnih naknadnih sprememb ob koncu razvojne faze vedno zahteva konsistentno in zlasti dosledno testiranje vseh funkcionalnosti, zanesljivosti in ponovljivosti. To se običajno izvaja v okviru cikličnih, tako imenovanih R&R testov na izbranem številu testnih vzorcev. Na osnovi analize dobljenih rezultatov se lahko okvirno oceni in določi tudi predvideno verjetnostno porazdelitev in statistično uspešnost testiranja širše populacije (angl. first pass yield, FPY). Končni cilj vsakega avtomatskega testnega sistema ATS je v največji možni meri, zanesljivo, kvalitetno in časovno učinkovito testiran produkt. To pa je obenem tudi garancija za želeno delovanje naprave ali sistema pri stranki.

Language:Slovenian
Keywords:Avtomatski testni sistem ATS, Testne metode in tehnologije, Testna aplikacija, Python/TTL, KLISH, GUI, Enota CTR8540, ICT/Boundary scan, JTAG, Testni nivoji (programiranje, funkcijski, termični, sistemski, kofiguracijski), Verifikacija R&R, NPI, Informacijski sistem, Analiza rezultatov in problemov
Work type:Specialist thesis
Organization:FE - Faculty of Electrical Engineering
Year:2016
PID:20.500.12556/RUL-84945 This link opens in a new window
Publication date in RUL:08.09.2016
Views:1707
Downloads:538
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Secondary language

Language:English
Title:TECHNOLOGIES AND APPROACHES TO PRODUCTION TESTING OF COMPLEX ELECTRONIC DEVICES AND SYSTEMS
Abstract:
ABSTRACT This postgraduate specialist thesis deals with the test approaches, methods, technologies and processes in the production testing cycle of complex electronic devices and systems. The general topics in the introductory chapters are followed by a practical example of a realization of such a test system with typical problems and solving methods we are facing. In the central part, the entire design, verification and final implementation of the individual phases of the automatic test system ATS for products testing in mass production are presented in general. From the planning and realization point of view, this is a multiple stage process which is logically structured into separate individual and independent test groups or test levels. This division usually covers ICT and Boundary scan level testing for connections integrity on the board and component level, firmware programming, functional, thermal, system and configuration level. Each of these levels is an important step in the production cycle of the device and must comply with certain specific characteristics. The process of transition between these levels is accurately controlled and pre-determined. The input condition of each subsequent test level is a successfully completed previous test level. Process control is ensured by test system architecture and automated test software application GUI. This application operates in conjunction with the network infrastructure, test server and data base information system for storing test results (SQL-DB). The practical implementation of the entire manufacturing test system solution is presented with selected device from microwave data transmission area, developed and produced by Aviat Networks, where I also work. My work here mainly refers to the areas covered by the main title theme. The device for which the practical test system solution was developed is a digital signal processing unit or the so-called Microwave router CTR8540. This is one of the major projects where I was actively involved from the beginning in the development phase of a complete test system, from the initial concept and ideas to the final realization. The focus of this work is on input test requirements and specifications, testing methods and approaches, individual test levels presentation, test applications development, final verification and implementation, test results analysis and on the real problems solving before and during the production phase. The final part gives some options for optimizations and improvements of the test process, which is quite dynamic and still evolving in the context of new technologies and approaches. When we are introducing such changes, we must always take into account a larger number of factors (financial, temporal, technical and available resources). This is especially important if a test process has been previously already consolidated. Any unscheduled production testing stoppage means an additional cost, worse balance and various other negative impacts. Therefore, such changes require good reasons and well-tested solutions. Realization and implementation of the originally specified requirements or any subsequent changes at the end of the development cycle always require consistent verification testing of all functionalities, reliability and repeatability. This is usually done in the context of cyclical testing of a pre-determined number of test samples, the so-called R&R testing phase. Based on the analysis of R&R test results, we can assess the estimated probability distribution and statistical performance for the wider test units population, the so-called first pass yield (FPY). The ultimate goal of any automated test system is as far as possible good, reliable, high-quality and time-efficient pre-tested product. It is also a warranty for the desired operation of the device or system at the customer.

Keywords:Automatic test system ATS, Test methods and technologies, Test application, Python/TTL, KLISH, GUI, CTR8540, ICT/Boundary Scan, JTAG, Test levels (programming, functional, thermal, system, configuration), Verification R&R, NPI, Information system, Analysis of test results and problems

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