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Sistem za pospešeno staranje segmetov svetil na podlagi svetlečih diod
ID SIMONIČ, IGOR (Author), ID Buermen, Miran (Mentor) More about this mentor... This link opens in a new window

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PID: 20.500.12556/rul/96e415cc-7838-4e5e-9983-9195cf0c911d

Abstract
Uporaba svetil na podlagi svetlečih diod (LED) strmo narašča, saj tovrstna svetila nudijo številne prednosti med katerimi velja izpostaviti dolgo življenjsko dobo in učinkovito izrabo električne energije. Zaradi homogene svetlobe, visoke svetilnosti in odzivnosti so nepogrešljiva tudi v sodobnih industrijskih sistemih s strojnim vidom. V tovrstnih sistemih je kakovost in zanesljivost svetila še posebej pomembna. Tega se zavedamo tudi v podjetju Sensum, zato smo dodatno okrepili vhodno kontrolo kakovosti segmentov, ki so osrednji sestavni del LED svetil. V ta namen smo razvili sistem za pospešeno staranje, ki s toplotno in tokovno obremenitvijo segmentov svetil odkriva morebitne napake elektronskih komponent ali proizvodnega procesa, ki bi sicer vodile do prezgodnje odpovedi vgrajenega LED svetila. Sistem za pospešeno staranje omogoča priklop do 32-ih segmentov svetil. Pri tem je na razpolago 128 stabilnih tokovnih virov. Sistem neprestano spremlja napetost in temperaturo segmentov svetil in na podlagi analize zbranih podatkov sklepa o pravilnost njihovega delovanja. Potek procesa pospešenega staranja lahko spremljamo in prilagajamo preko uporabniškega vmesnika, ki nam po potrebi posreduje obvestila o morebitnih odkritih napakah na segmentih svetil.

Language:Slovenian
Keywords:svetleče diode, LED, pospešeno staranje, strojni vid, SPINE, napetostno nastavljiv tokovni vir, temperaturna obremenitev, električna obremenitev
Work type:Undergraduate thesis
Organization:FE - Faculty of Electrical Engineering
Year:2016
PID:20.500.12556/RUL-84204 This link opens in a new window
Publication date in RUL:19.07.2016
Views:1836
Downloads:466
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Secondary language

Language:English
Title:A system for accelerated aging of light emitting diode modules
Abstract:
Due to the small source size, long lifetime and high luminous efficacy, light emitting diode (LED) light sources are becoming increasingly popular in numerous fields. The short response time, high intensity and homogeneity of the emitted light make the LED sources indispensable in machine vision system. In such systems, the quality and reliability of the light sources is of utmost importance. In this thesis, we have developed a system for accelerated ageing of LED modules by thermal and current stress. The main goal of the accelerated aging is to rapidly assess the quality of LED modules and identify assembly errors that might lead to premature failure of the module and thereby of the light source. The system for accelerated ageing is designed to operate 32 LED modules and provides 128 digitally controlled current sources. The system is continuously monitoring the voltage and temperature of the tested LED modules and instantly reports any detected failures or deviations from normal operation. The accelerated aging process can be fully managed from a user friendly interface.

Keywords:LED, accelerated ageing, machine vision, SPINE, voltage controlled current source, temperature stress, electrical stress

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