izpis_h1_title_alt

Zasnova, razvoj in izdelava testne naprave za preizkušanje vgrajenih sistemov za zajemanje podatkov
ID JAKOPIN, BLAŽ (Author), ID Bojkovski, Jovan (Mentor) More about this mentor... This link opens in a new window

.pdfPDF - Presentation file, Download (6,79 MB)
MD5: FBCB599301E2B38D7AB2C87FB54FC746
PID: 20.500.12556/rul/0e017e34-263d-48f9-918d-4fde8e914788

Abstract
Diplomska naloga opisuje zasnovo, razvoj in izdelavo testne naprave za preizkušanje vgrajenih sistemov za zajemanje podatkov. Naprava bo uporabljena v večjem avtomatiziranem testnem sistemu, ki na eni strani generira referenčne vrednosti s testno napravo, na drugi pa te vrednosti meri z napravo, ki je testirana, in primerja izmerjeno vrednost z referenco, da ugotovi, ali je meritev znotraj toleranc. Z obzirom na tehnične specifikacije in zahteve testnega sistema se lotimo zasnove testne naprave, ki naj bi v prvi vrsti nastopila kot izboljšava že obstoječe rešitve. Zasnova testne naprave obsega analizo že obstoječih rešitev in predlog izboljšave podprt s teoretičnimi predpostavkami in ugotovitvami. Zastavimo koncept celostne rešitve problema testiranja vgradnih sistemov za zajemanje podatkov po principu PXI sistemov, v okviru diplomske naloge pa tudi razvijemo in izgradimo integralni del testnega sistema, modul funkcijskega generatorja.

Language:Slovenian
Keywords:avtomatski testni sistem, generiranje signalov, SCPI
Work type:Undergraduate thesis
Organization:FE - Faculty of Electrical Engineering
Year:2014
PID:20.500.12556/RUL-29452 This link opens in a new window
Publication date in RUL:12.09.2014
Views:2367
Downloads:1103
Metadata:XML DC-XML DC-RDF
:
Copy citation
Share:Bookmark and Share

Secondary language

Language:English
Title:The design, development and production of test apparatus for the testing of embedded systems for data acquisition
Abstract:
This thesis describes the design, developement and production of a device for testing different embedded data aquisition systems. This device will be a part of a larger automated testing system, that uses generated values as a reference to test a specific data acquisition device and notifies the user when a specific test case falls out of tolerance. With respect to the technical specification and requests from the existing testing system we start with the planning and designing a device that should firstly improve the existing solutions. The design of such a device is composed of analisys of already known solutions and suggestions on how to improve them, supported with theoretical assumptions. First we set up a larger concept of a device that could provide an overall solution for automated testing of embedded data acquisition systems similar to a PXI (PCI eXtensions for Instrumentation) system, but we focus only on a smaller part of this task – the signal generation module.

Keywords:automatic testing system, signal generation, SCPI

Similar documents

Similar works from RUL:
Similar works from other Slovenian collections:

Back