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On the thermal stability of multilayer optics for use with high X-ray intensities
ID Zakharova, Margarita (Author), ID Rek, Zlatko (Author), ID Šarler, Božidar (Author), ID Bajt, Saša (Author)

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Abstract
High-intensity X-ray free electron laser (XFEL) beams require optics made of materials with minimal radiation absorption, high diffraction efficiency, and high radiation hardness. Multilayer Laue lenses (MLLs) are diffraction-based X-ray optics that can focus XFEL beams, as already demonstrated with tungsten carbide/silicon carbide (WC/SiC)-based MLLs. However, high atomic number materials such as tungsten strongly absorb X-rays, resulting in high heat loads. Numerical simulations predict much lower heat loads in MLLs consisting of low atomic number Z materials, although such MLLs have narrower rocking curve widths. In this paper, we first screen various multilayer candidates and then focus on Mo2C/SiC multilayer due to its high diffraction efficiency. According to numerical simulations, the maximum temperature in this multilayer should remain below 300°C if the MLL made out of this multilayer is exposed to an XFEL beam of 17.5 keV photon energy, 1 mJ energy per pulse and 10 kHz pulse repetition rate. To understand the thermal stability of the Mo2C/SiC multilayer, we performed a study on the multilayers of three different periods (1.5, 5, and 12 nm) and different Mo2C to SiC ratios. We monitored their periods, crystallinity, and stress as a function of annealing temperature for two different heating rates. The results presented in this paper indicate that Mo2C/SiC-based MLLs are viable for focusing XFEL beams without being damaged under these conditions.

Language:English
Keywords:x-ray optics, multilayer Laue lens, thermal stability, numerical simulation
Work type:Article
Typology:1.01 - Original Scientific Article
Organization:FS - Faculty of Mechanical Engineering
Publication status:Published
Publication version:Version of Record
Year:2024
Number of pages:Str. 1933-1948
Numbering:Vol. 14, iss. 8
PID:20.500.12556/RUL-159255 This link opens in a new window
UDC:535:519.62
ISSN on article:2159-3930
DOI:10.1364/OME.527226 This link opens in a new window
COBISS.SI-ID:200647939 This link opens in a new window
Publication date in RUL:04.07.2024
Views:188
Downloads:35
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Record is a part of a journal

Title:Optical materials express
Shortened title:Opt. mater. express
Publisher:Optical Society of America
ISSN:2159-3930
COBISS.SI-ID:17733142 This link opens in a new window

Licences

License:CC BY 4.0, Creative Commons Attribution 4.0 International
Link:http://creativecommons.org/licenses/by/4.0/
Description:This is the standard Creative Commons license that gives others maximum freedom to do what they want with the work as long as they credit the author.

Secondary language

Language:Slovenian
Keywords:rentgenska optika, večplastna leča Laue, termična stabilnost, numerične simulacije

Projects

Funder:Other - Other funder or multiple funders
Funding programme:Cluster of Excellence "CUI: Advanced Imaging of Matter" of the Deutsche Forschungsgemeinschaft (DFG)–EXC 2056
Project number:390715994

Funder:Other - Other funder or multiple funders
Funding programme:Center for Free-Electron Laser Science (CFEL)
Name:Innovative methods for imaging with the use of x-ray free-electron laser (XFEL) and synchrotron sources: simulation of gas-focused micro-jets

Funder:ARIS - Slovenian Research and Innovation Agency
Project number:P2-0162
Name:Večfazni sistemi

Funder:ARIS - Slovenian Research and Innovation Agency
Project number:J2-4477
Name:Razvoj inovativnih brezmrežnih metod za večfizikalne in večnivojske simulacije vrhunskih tehnologij

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