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AVTOMATIZIRANO TESTIRANJE FUNKCIONALNE VARNOSTI MOTORSKEGA POGONSKEGA SISTEMA
ID Bavcon, Vid (Author), ID Možek, Matej (Mentor) More about this mentor... This link opens in a new window

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Abstract
V tem diplomskem delu je predstavljena pot od začetka izdelave modeliranega testnega okolja za izvajanje določenih funkcionalnih testov na merjencu, do testiranja te programske opreme. V tem primeru se testira odziv vezja, ko se mu za kratek čas po določenem časovnem poteku spreminja napajalna napetost. Programska oprema implementira napetostne pulze točno določene oblike okoli napajalne napetosti (pulzi so točno določeni in opisani v standardu), ter iz merjenca zajema podatke. Merjenec je v tem primeru krmilnik za pogonski elektromotor v hibridnem avtomobilu.

Language:Slovenian
Keywords:Napetostni pulz, FPGA, zajemanje podatkov, generiranje signalov, blokovno programiranje, Simulink model, hitrost spremembe signala, vzorčna frekvenca, dvižni čas, strojna oprema v zanki.
Work type:Bachelor thesis/paper
Organization:FE - Faculty of Electrical Engineering
Year:2023
PID:20.500.12556/RUL-147303 This link opens in a new window
COBISS.SI-ID:157375491 This link opens in a new window
Publication date in RUL:29.06.2023
Views:1083
Downloads:88
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Secondary language

Language:English
Title:AUTOMATED FUNCTIONAL SAFETY TESTING OF MOTOR DRIVE SYSTEM
Abstract:
This thesis presents the process from the beginning of testing environment development for executing specific functional tests on a device, to testing of this software. In this case, the behavior of the circuit is being tested when the supply voltage is superimposed with a series of a predefined voltage pulses for a short period of time. The software implements precisely defined voltage pulses around the supply voltage (the pulses are precisely defined and described in the standard) and captures data from the device under test. In this case, the device under test is an electric motor drive controller in a hybrid car.

Keywords:Voltage pulse, FPGA, data capture, signal generation, block programming, Simulink model, slew rate, sampling frequency, rise time, Hardware in loop.

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