The thesis addresses the challenges of designing a system for large-scale testing of an application specific integrated circuit. In the beginning, the theoretical basis for digital circuit testing is presented. It continues with a description of the device tested and a plan for its testing. Furthermore, the work describes the hardware and software that was developed for this project. The thesis concludes with a presentation of the project documentation.
The result of the development process is a functional system that is able to detect faults in the operation of a application-specific integrated circuit with great reliability. As a part of an automatic test handler, the system will be utilised by the company Renishaw Tehnični Inženiring d.o.o.
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