In this thesis, I have analyzed the dynamic behavior of metal oxide varistor (MOV), under temporary DC overvoltages (TOV)
The thesis begins with theory on metal oxide varistors, problematics of temporary overvoltages and it's effect on metal oxide varistor. In the second part, I described the measurements which provided me with the basic parameters for each MOV sample. In the second part of the measurements, each MOV sample was overloaded with such voltage that it caused a pin hole through MOV and it's destruction. From these measurements, I extrapolated basic characteristic parameters which I required for further simulation in LTspice software. In the last part, I have presented the simulations for all six MOV types and evaluated the model based on the measurements.
Simulating overload behavior of MOV can be very time efficient as well as financially beneficial, but they have to be accurate enough so that we can rely on them. Evaluation of the model has proven that simulations were accurate enough, to gain a good perspective on how the current will flow through the MOV, however it still needs some work to get it up to industry standards. Most problematic is the last part of the simulation in which the MOV is deep in thermal runaway. It's also important to mention the tolerances of mass-produced MOV, as manufacturers have a +/- 10% tolerance. Overall the proposed model works well, however it still needs some more measurements and simulations to improve.
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