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Examination of photovoltaic silicon module degradation under high-voltage bias and damp heat by electroluminescence
ID Brecl, Kristijan (Author), ID Bokalič, Matevž (Author), ID Topič, Marko (Author)

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Language:English
Keywords:electroluminescence, stress, ion migration, corrosion, photovoltaic power systems, PID
Work type:Article
Typology:1.01 - Original Scientific Article
Organization:FE - Faculty of Electrical Engineering
Publication status:Published
Publication version:Submitted Version
Publication date:21.03.2017
Year:2017
Number of pages:Str. 1-6
Numbering:Vol. 139, no. 3
PID:20.500.12556/RUL-106686 This link opens in a new window
UDC:621.383.51:535.376
ISSN on article:0199-6231
DOI:10.1115/1.4036056 This link opens in a new window
COBISS.SI-ID:11698772 This link opens in a new window
Publication date in RUL:12.03.2019
Views:1850
Downloads:893
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Record is a part of a journal

Title:Journal of solar energy engineering
Shortened title:J. sol. energy eng.
Publisher:American Society of Mechanical Engineers
ISSN:0199-6231
COBISS.SI-ID:6567943 This link opens in a new window

Secondary language

Language:Slovenian
Keywords:elektroluminiscenca, silicij, korozija, ionska migracija, fotovoltaika, PID

Projects

Funder:ARRS - Slovenian Research Agency
Project number:J2-7105
Name:Analiza nehomogenosti fotonapetostnih gradnikov in vpliv na zmogljivost sončnih elektrarn tekom življenjske dobe

Funder:ARRS - Slovenian Research Agency
Project number:P2-0197
Name:Fotovoltaika in elektronika

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