izpis_h1_title_alt

Study of the multilayer PCB CTEs by moiré interferometry
Han, Lei (Avtor), Voloshin, Arkady S. (Avtor), Emri, Igor (Avtor)

URLURL - Predstavitvena datoteka, za dostop obiščite http://dx.doi.org/10.1016/j.optlaseng.2004.05.009 Povezava se odpre v novem oknu

Izvleček
Microelectronics packaging has been developing rapidly due to the demands for faster, lighter and smaller products. Printed circuit boards (PCBs) provide mechanical support and electrical interconnection for electronic devices. Manytypes of composite PCBs have been developed to meet various needs. Recent trends in reliability analysis of PCBs have involved development of the structural integrity models for predicting lifetime under thermal environmental exposure; however the theoretical models need verification by the experiment. The objective of the current work is the development of an optical system and testing procedure for evaluation of the thermal deformationof PCBs in the wide temperature range. Due to the special requirements of the specimen and test condition, the existing technologies andsetups were updated and modified. The discussions on optical methods, thermal loading chambers, and image data processing are presented. The proposed technique and specially designed test bench were employed successfully to measure the thermal deformations of PCB in the -40°C to +160°Ctemperature range. The video-based moiré interferometry was used for generating, capturing and analysis of the fringe patterns. The obtained information yields the needed coefficients of thermal expansion (CTE) for tested PCBs.

Jezik:Angleški jezik
Ključne besede:moiré interferometry, printed circuit board, coefficient of thermal expansion, thermal deformations, image processing
Vrsta gradiva:Delo ni kategorizirano (r6)
Tipologija:1.01 - Izvirni znanstveni članek
Organizacija:FS - Fakulteta za strojništvo
Leto izida:2004
Št. strani:str. 613-626
Številčenje:Letn. 42, Št. 6
UDK:535
ISSN pri članku:0143-8166
COBISS.SI-ID:7606299 Povezava se odpre v novem oknu
Število ogledov:861
Število prenosov:240
Metapodatki:XML RDF-CHPDL DC-XML DC-RDF
 
Skupna ocena:(0 glasov)
Vaša ocena:Ocenjevanje je dovoljeno samo prijavljenim uporabnikom.
:
Objavi na:AddThis
AddThis uporablja piškotke, za katere potrebujemo vaše privoljenje.
Uredi privoljenje...

Gradivo je del revije

Naslov:Optics and lasers in engineering
Skrajšan naslov:Opt. lasers eng.
Založnik:Elsevier
ISSN:0143-8166
COBISS.SI-ID:6399749 Povezava se odpre v novem oknu

Podobna dela

Podobna dela v RUL:
Podobna dela v drugih slovenskih zbirkah:

Komentarji

Dodaj komentar

Za komentiranje se morate prijaviti.

Komentarji (0)
0 - 0 / 0
 
Ni komentarjev!

Nazaj