Study of the multilayer PCB CTEs by moiré interferometry
Han, Lei (Author), Voloshin, Arkady S. (Author), Emri, Igor (Author)

URLURL - Presentation file, Visit http://dx.doi.org/10.1016/j.optlaseng.2004.05.009 This link opens in a new window

Microelectronics packaging has been developing rapidly due to the demands for faster, lighter and smaller products. Printed circuit boards (PCBs) provide mechanical support and electrical interconnection for electronic devices. Manytypes of composite PCBs have been developed to meet various needs. Recent trends in reliability analysis of PCBs have involved development of the structural integrity models for predicting lifetime under thermal environmental exposure; however the theoretical models need verification by the experiment. The objective of the current work is the development of an optical system and testing procedure for evaluation of the thermal deformationof PCBs in the wide temperature range. Due to the special requirements of the specimen and test condition, the existing technologies andsetups were updated and modified. The discussions on optical methods, thermal loading chambers, and image data processing are presented. The proposed technique and specially designed test bench were employed successfully to measure the thermal deformations of PCB in the -40°C to +160°Ctemperature range. The video-based moiré interferometry was used for generating, capturing and analysis of the fringe patterns. The obtained information yields the needed coefficients of thermal expansion (CTE) for tested PCBs.

Keywords:moiré interferometry, printed circuit board, coefficient of thermal expansion, thermal deformations, image processing
Work type:Not categorized (r6)
Tipology:1.01 - Original Scientific Article
Organization:FS - Faculty of Mechanical Engineering
Number of pages:str. 613-626
Numbering:Letn. 42, Št. 6
ISSN on article:0143-8166
COBISS.SI-ID:7606299 Link is opened in a new window
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Record is a part of a journal

Title:Optics and lasers in engineering
Shortened title:Opt. lasers eng.
COBISS.SI-ID:6399749 This link opens in a new window

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