This thesis describes the design, developement and production of a device for testing different embedded data aquisition systems. This device will be a part of a larger automated testing system, that uses generated values as a reference to test a specific data acquisition device and notifies the user when a specific test case falls out of tolerance.
With respect to the technical specification and requests from the existing testing system we start with the planning and designing a device that should firstly improve the existing solutions. The design of such a device is composed of analisys of already known solutions and suggestions on how to improve them, supported with theoretical assumptions. First we set up a larger concept of a device that could provide an overall solution for automated testing of embedded data acquisition systems similar to a PXI (PCI eXtensions for Instrumentation) system, but we focus only on a smaller part of this task – the signal generation module.