20.500.12556/RUL-176850 Workflow and practical guidance for identical location scanning electron microscopy reliable tracking of localized transformations Understanding material transformations at the nano- and microscale is essential for advancing electrocatalysis, energy storage, and other applications. Conventional SEM imaging, which captures random locations before and after treatment, struggles to distinguish real transformations from inherent sample heterogeneity. Identical Location SEM (IL-SEM) overcomes this by enabling re-imaging of the exact same region, offering clear evidence of localized changes in morphology, structure, and composition. Despite its simplicity and wide applicability, IL-SEM remains underutilized. This article presents a detailed, practical guide to implementing IL-SEM reliably, including sample alignment, multiscale imaging, and consistent re-localization. Key methodological tips and solutions to common challenges are provided, making the approach accessible even for non-expert users. To showcase its versatility, we present case studies involving electrocatalysts, alloys, and nanostructured materials. Moreover, by integrating IL-SEM with energy-dispersive spectroscopy (EDS) and electron backscatter diffraction (EBSD), we demonstrate how compositional and crystallographic evolution can be tracked alongside morphological changes. This optimized workflow offers a powerful, non-destructive method for visualizing dynamic material behavior and provides a foundation for IL-SEM to become a standard technique for studying structural evolution across diverse materials research fields. electrocatalysis identical location electron microscopy IL-SEM materials characterization scanning electron microscopy surface analysis true false true Angleški jezik Ni določen Članek v reviji 2025-12-11 13:44:49 2025-12-11 13:44:57 2025-12-24 04:04:38 0000-00-00 00:00:00 2025 0 0 16 str. iss. 9, art. e01290 Vol. 9 1 Sep. 2025 0000-00-00 Zaloznikova Objavljeno NiDoloceno 0000-00-00 0000-00-00 0000-00-00 54 2366-9608 10.1002/smtd.202501290 245640707 Small_Methods_-_2025_-_Tomc_-_Workflow_and_Practical_Guidance_for_Identical_Location_Scanning_Electron_Microscopy__Reliable.pdf Small_Methods_-_2025_-_Tomc_-_Workflow_and_Practical_Guidance_for_Identical_Location_Scanning_Electron_Microscopy__Reliable.pdf 1 2313E1BEA85B022505A6E568AE3FE0B0 898e82e7f4118fe0fe42cedb6ed63cf9c83d574b23205f1c85255c7ca5b7a3d2 0adad763-d68f-11f0-9328-0050569b8976 https://repozitorij.uni-lj.si/Dokument.php?lang=slv&id=223470 https://onlinelibrary.wiley.com/doi/10.1002/smtd.202501290 1 c911b62a-d68e-11f0-9328-0050569b8976 https://repozitorij.uni-lj.si/Dokument.php?lang=slv&id=223469 Fakulteta za kemijo in kemijsko tehnologijo 0 0 0