20.500.12556/RUL-174182 Razvoj sistema za proizvodno testiranje namenskih čipov Development of a system for application specific integrated circuits production testing Pri razvoju in proizvodnji integriranih vezij igra njihovo dosledno testiranje ključno vlogo. Ponuja dragocene povratne informacije o zasnovi in kakovosti proizvodnje. To še posebej velja za testiranje v zgodnjih fazah proizvodnje, kot je na ravni silicijevih rezin. Komercialna testna oprema je pogosto zelo draga, zato smo si zastavili izziv: razviti lasten testni sistem, prilagojen specifični družini integriranih vezij. V delu najprej predstavimo razloge in osnovne pristope testiranja. Sledi opis testiranca, njegove namembnosti ter ključnih testnih zahtev za produkcijsko okolje. Osrednji del naloge zajema razvoj testne naprave in pripadajoče programske kode za izvajanje produkcijskih testov na ravni silicijevih rezin. Testna naprava z modularno zasnovo in s hierarhično strukturo programske opreme omogoča poleg testiranja čipov na silicijevih rezinah tudi testiranje že pakiranih čipov. Skupaj s kalibrirano testno napravo, pozicionirnikom rezin ter računalniško aplikacijo za avtomatizirano testiranje smo razvili celovit testni sistem, prilagojen ciljni družini integriranih vezij. V nadaljevanju pojasnimo pomen statistične analize meritev in optimizacije testnega časa. Izpostavimo tudi pomen in postopek izvedbe izbranih kvalifikacijskih testov. Rezultat projekta, katerega del je zaključna naloga, je uspešno izdelan in cenovno ugoden testni sistem, ki bo v prihodnosti omogočal testiranje več deset tisoč integriranih vezij letno. Consistent testing plays a crucial role in the development and production of integrated circuits, providing valuable feedback on both circuit design and manufacturing quality. Especially critical during early stages like wafer-level testing. Since commercial test equipment is often prohibitively expensive, we set out to develop a custom test system tailored to a specific family of integrated circuits. The thesis begins with testing motivation and overview of the fundamental approaches used, followed by a description of the device under test and its intended purpose, along with key testing requirements for the production environment. The thesis core focuses on the test device development and all accompanying software, designed to perform production-level tests at the wafer stage. Thanks to its modular design and hierarchical software architecture, the test device supports both wafer-level and packaged chip testing. Together with a calibrated test device, a wafer positioner, and a computer application for automated testing, a complete test system was developed, tailored to the target integrated circuits family. The thesis also addresses the importance of statistical data analysis and test time optimization. As an additional contribution, the procedure and relevance of selected qualification tests are briefly presented. The outcome of the project, part of which is this thesis, is a fully functional, cost-effective test system that is expected to support testing of several tens of thousands of integrated circuits annually. Silicijeva rezina sortirnik rezin testna naprava integrirana vezja avtomatizirana testna oprema testiranje Silicon wafer wafer sort test device integrated circuits automated test equipment -- ATE testing true false false Slovenski jezik Angleški jezik Magistrsko delo/naloga 2025-09-29 14:15:01 2025-09-29 14:15:17 2025-11-20 14:29:14 0000-00-00 00:00:00 2025 0 0 0000-00-00 NiDoloceno NiDoloceno NiDoloceno 0000-00-00 0000-00-00 0000-00-00 63187 258021635 Rotovnik_Matic_-_Razvoj_sistema_za_proizvodno_testiranje_namenskih_cipov.pdf Rotovnik_Matic_-_Razvoj_sistema_za_proizvodno_testiranje_namenskih_cipov.pdf 1 238160D8D534291EE52D1003701B3DEC 145ebad82480e123a15f9e0a65d1e6840f1121ec8f7a0d7f7536a85aee3885b5 c3290ebf-9d2d-11f0-9328-0050569b8976 https://repozitorij.uni-lj.si/Dokument.php?lang=slv&id=218946 Fakulteta za elektrotehniko 0 0 0