20.500.12556/RUL-134066 Stress induced inhomogeneities in crystalline silicon solar cells from characterization to advanced electrical modelling In this contribution we present a fully scalable, quasi-SPICE distributed modelling approach for a wholesome analysis of stress induced, as well as inherent inhomogeneities (material impurities, grain boundaries) in silicon solar cells and PV modules based on electroluminescence imaging. We describe the derivation of electrical models for different IEC TS 60904-13 recognised stress induced inhomogeneities, namely the active and the inactive cracks, dead cell areas, and contact finger interruptions, and highlight their effects on the current-voltage characteristic of the cell. We validate our model on a selection of experimental cases of sample silicon solar cells on the basis of a comparative study of current-voltage characteristics and electroluminescence images. We demonstrate the applicability of our model on a complexly damaged full-sized sample cell, showing excellent agreement with the measurements. electroluminescence microcracks modelling inhomogeneities elektroluminiscenca mikrorazpoke modeliranje nehomogenosti true false false Angleški jezik Slovenski jezik Neznano 2021-12-23 10:22:32 2021-12-23 10:22:33 2022-09-13 03:53:04 0000-00-00 00:00:00 2020 0 0 Str. 286-289 0000-00-00 PostprintKoncna Objavljeno NiDoloceno 0000-00-00 0000-00-00 0000-00-00 621.383.51 2196-100X 10.4229/EUPVSEC20202020-2CO.15.6 36809731 36337923 RAZ_Kikelj_Miha_2020.pdf RAZ_Kikelj_Miha_2020.pdf 1 183C2BEE945F714356F07AA0578BF487 220828108dfb3cb643e4329ee979ac98e99c0e6c2a4591b14107f96157d9769d 99e6f138-63da-11ec-abdb-00155dcfd717 https://repozitorij.uni-lj.si/Dokument.php?lang=slv&id=152373 Fakulteta za elektrotehniko 0 0 0