20.500.12556/RUL-106686 Examination of photovoltaic silicon module degradation under high-voltage bias and damp heat by electroluminescence electroluminescence stress ion migration corrosion photovoltaic power systems PID elektroluminiscenca silicij korozija ionska migracija fotovoltaika PID true false false Angleški jezik Slovenski jezik Članek v reviji 2019-03-12 11:12:44 2019-03-12 11:12:45 2022-08-19 03:46:41 0000-00-00 00:00:00 2017 0 0 Str. 1-6 no. 3 Vol. 139 Jun. 2017 0000-00-00 PreprintVObjavi Objavljeno NiDoloceno 0000-00-00 0000-00-00 2017-03-21 621.383.51:535.376 0199-6231 10.1115/1.4036056 11698772 6567943 RAZ_Brecl_Kristijan_i2017.pdf RAZ_Brecl_Kristijan_i2017.pdf 1 1CAAF9F23F3851C45C05B504088D3616 54368ac4b359e3b3184d2ceca4e6e1eb533c542c1a0bd43ecfaf1c81daffb3e4 5d59c90a-a1b6-11eb-a523-00155dcfd717 https://repozitorij.uni-lj.si/Dokument.php?lang=slv&id=117469 http://solarenergyengineering.asmedigitalcollection.asme.org/article.aspx?articleid=2607879 1 https://repozitorij.uni-lj.si/Dokument.php?lang=slv&id=117468 Fakulteta za elektrotehniko 0 0 0