Improving light outcoupling and addressing measurement specifics in perovskite light-emitting diodes with light management foilsKovačič, Milan (Avtor) Jošt, Marko (Avtor) Krč, Janez (Avtor) Topič, Marko (Avtor) Near-infrared perovskite light-emitting diodes (PeLEDs), with four perovskite(PK) layer thicknesses and optional micro-textured light management (LM) foil,are fabricated to evaluate their effects on light outcoupling efficiency. Deviceswith a 70 nm thick PK exhibit highest external quantum efficiencies (EQE),compared to those with thinner or thicker PK layers. The PK thickness influencesthe overall thin-film stack and, consequently, the light outcoupling. LM foilssignificantly improve light outcoupling across all devices, with the thickest PKlayer (160 nm) benefiting the most (60% increase), while the thinnest (40 nm)sees the least improvement (30%). Measured trends align well with opticalmodeling results, further highlighting the impact of sample holder design andpixel position on results. Theoretical optimization of PK thickness indicatesunique optimal values for devices with or without LM foils. For devices incor-porating LM foils, simulations predict an optimal PK thickness of 80 nm and anEQE of 27%. In contrast, for devices without LM foils, the optimal PK thickness of60 nm corresponds to simulated EQE of 17%. In all cases, LM foils significantlyenhance light outcoupling from bottom-emitting PeLEDs while emphasizing thenecessity to include LM foils in the thin-film layer stack optimization process.20252025-08-19 10:45:16Članek v reviji171204UDK: 621.383.51:549.641ISSN pri članku: 2699-9293DOI: 10.1002/adpr.202400188COBISS_ID: 233035267sl