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<metadata xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dc="http://purl.org/dc/elements/1.1/"><dc:title>Design and characterization of a low noise circuit for transfer function measurements of custom integrated photo-diodes array.</dc:title><dc:creator>TUŠEVSKI,	AJDA	(Avtor)
	</dc:creator><dc:creator>Strle,	Drago	(Mentor)
	</dc:creator><dc:creator>Fuge,	Jon	(Komentor)
	</dc:creator><dc:subject>Noise</dc:subject><dc:subject>measuremnet characteristics of photo-diode.</dc:subject><dc:description>This masters thesis describes the design and characterization of a low-noise circuit that makes it possible to measure the transfer function of a custom photo-diode array using Knife-edge method. The most important errors of the trans-impedance amplifier and external components that contribute to the uncertainty of the measurement are analyzed. Dark current effect and its temperature dependence are also included in the analysis. In addition we describe the experiment and results of the measurements using Knife edge method to obtain the MTF (modular transfer function). In this experiment, a light edge is first aligned with the edge of the photodiode and then moved across the surface of the photo-diode until the entire photodiode is lit. Measurement of the photo-diode current during that experiment gives a modular transfer function (MTF).</dc:description><dc:date>2019</dc:date><dc:date>2019-09-11 09:25:05</dc:date><dc:type>Magistrsko delo/naloga</dc:type><dc:identifier>110026</dc:identifier><dc:identifier>VisID: 47041</dc:identifier><dc:language>sl</dc:language></metadata>
