Improving IV curve measurement accuracy of high-efficiency PV modules using extrapolation based on a dual load capacitor scanning methodOražem, Jonas Aleksander (Avtor) Topič, Marko (Avtor) Jankovec, Marko (Avtor) difussion capacitancedynamic modellinghigh-efficiency PV modulesIV curve extrapolationload capacitor IV scanning methodmeasurement accuracyWith continuous progress in photovoltaic (PV) technology, the conversion efficiency of commercial PV modules is steadily increasing well above 20 %, even exceeding 24 %. Such high-efficiency (HE) PV modules typically exhibit long free-carrier lifetimes, resulting in high diffusion capacitances. For routine field testing, technicians rely on fast, affordable and portable IV curve scanners, which typically employ the load capacitor scanning method. When applied to HE PV modules with high internal capacitance, this method frequently leads to IV curve distortion, resulting in a significant underestimation of the measured maximum power point (MPP). In this paper, we propose a novel extrapolation technique that corrects the distortion of the measured IV curve through two consecutive IV scans using two different load capacitors. The extrapolation algorithm uses a dynamic electrical model of the whole system, including the PV module and the measurement setup, to compensate for the effect of the PV module’s capacitance on the acquired IV curve shape. It extracts two free parameters related to series resistance and the lifetime of the minority carriers that give the best match between the two extrapolated IV curves. We validated the method on four different state-of-the-art HE PV modules (HIT, TOPCon, IBC, and PERC), reliably reducing the MPP error from the initial up to 4 % to less than 1 %.20252026-01-09 13:31:06Članek v reviji177847sl