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<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:dc="http://purl.org/dc/elements/1.1/"><rdf:Description rdf:about="https://repozitorij.uni-lj.si/IzpisGradiva.php?id=172543"><dc:title>Generating positive training images for supervised multi-class surface anomaly detection</dc:title><dc:creator>Spasev,	Naum	(Avtor)
	</dc:creator><dc:creator>Skočaj,	Danijel	(Mentor)
	</dc:creator><dc:subject>anomaly detection</dc:subject><dc:subject>anomaly classification</dc:subject><dc:subject>generative AI</dc:subject><dc:subject>FLUX.1 Kontext</dc:subject><dc:subject>MVTec</dc:subject><dc:description>This thesis tackles the problem of limited defective samples in industrial
surface anomaly detection and classification, by leveraging generative artificial
intelligence for creating synthetic data. Manufacturing processes typically
produce few faulty items, creating significant obstacles for conventional
machine learning methods like supervised learning, that require substantial
amounts of labeled training data to build effective detection and classification
systems. We explore the use of the FLUX.1 Kontext diffusion model
to generate synthetic yet realistic surface anomalies on industrial product
images, specifically applied to the MVTec Hazelnut dataset. Our approach
develops a comprehensive pipeline that produces both anomalous images and
corresponding segmentation masks, enabling effective training of anomaly
detection and anomaly classification models. Through systematic evaluation
using established methodologies, we compare models trained with synthetic
data augmentation against baseline model trained solely on original data.
Results demonstrate improvements in anomaly detection, localization and
classification capabilities, showing that generative models can effectively address
the fundamental challenge of limited defective samples in industrial
quality control.</dc:description><dc:date>2025</dc:date><dc:date>2025-09-08 12:35:10</dc:date><dc:type>Diplomsko delo/naloga</dc:type><dc:identifier>172543</dc:identifier><dc:language>sl</dc:language></rdf:Description></rdf:RDF>
