The thesis addresses the development of an application, that computes the predicted lifetime of electronic circuits based on selected input parameters. The application is capable of computing circuit's Failure in Time (FIT) values, as well as Mean Time Between Failures (MTBF) and Chance of Failure for user-selected timeframe. Calculations can be done for a single electronic component or an entire circuit. Components, that are included in the application are capacitors, diodes, transistors, resistors, integrated circuits and inductors.
Mathematical model for calculation of above mentioned parameters was developed using the IEC 61709 standard - Electric components - Reliability - Reference conditions for failure rates and stress models for conversion. The method used for calculation of failure rates is called the part stress method.
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